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Eventos Metrologia Industrial
ZEISS Innovation Day
Data
06-06-2019
Local
USA / Grand Rapids, MI
Expositor
Mark C. Malburg, Ph.D., president of Digital Metrology Solutions, will be providing instruction on surface finish, form & geometry and will also discuss comparison between ISO and ASME standards. Hands-on demonstrations with a ZEISS expert are available. Feel free to bring your own part to be measured.
Learn how metrology can help you do your job and enjoy lunch on us! Attendees will also be entered into a drawing to win a pair of ZEISS binoculars.